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Cohu Ismeca NY32 Test Handler

Cohu Ismeca NY32 Test Handler: can it run your thinnest DFN/QFN, hit your throughput targets, and catch 5 µm sidewall defects? See the real selection criteria before you commit.

Cohu Ismeca NY32 Test Handler EQUIPMENT IMAGE
Configuration Review Model and installed options
New / Used Supply Subject to project availability
Global Delivery Destination-based assessment
Technical RFQ Package and process matching

32-Position Turret Platform for Semiconductor Test, Inspection, and Finishing

The Cohu Ismeca NY32 consolidates semiconductor test, inspection, and finishing into a single handling sequence. Electrical contacting, multi-surface vision inspection, and output packaging all occur within one continuous rotation—not as separate offline steps.

Throughput and Turret Operation

The 32-position turret indexes devices through a fixed sequence of process stations, including up to 16 electrical test sites and multiple vision positions. This eliminates the back-and-forth transfer motion typical of pick-and-place handlers.

Throughput reaches 30,000 units per hour for discrete and DFN packages, with LED devices achieving up to 35,000 UPH. Typical MTBA exceeds 2 hours and MTBF beyond 168 hours.

NVcore Inspection Capability

Inspection centers on the NVcore vision platform, which performs full six-sided inspection covering top, bottom, and all four sidewalls.

For advanced packaging, 3D Flex technology measures true ball and bump coplanarity—critical for BGA and WLCSP devices where solder joint integrity affects board-level reliability. Inspection runs inline during turret rotation, so throughput is unaffected.

Cohu Ismeca NY32 32-position turret semiconductor test and inspection handler

Configurable Contacting Force

The platform handles a broad spectrum of device sensitivities through configurable Z-axis force profiles:

  • Standard independent Z-axis contacting: up to 7N per site

  • Optional high-force configuration: up to 27N

  • Pneumatic plunger option: up to 50N

This range allows fragile thin dies to be handled without damage while still achieving reliable contact on thick power packages.

Device Range and Output Options

Applicable device range spans 0.3 × 0.6 mm to 17 × 17 mm, covering discrete leaded packages, power discretes, DFN/QFN, SOIC, LED, BGA, MEMS, and bare die.

Output options include tape and reel, tube, tray, and bulk. An auto reel changer supports lights-out operation. In-tape inspection with automatic reject and replacement addresses a common quality gap in tape-and-reel finishing, where one defective unit can compromise an entire reel.

NY32 Selection Checklist

Decision DimensionParameters to VerifyYour Actual Situation
Package compatibilityOverall range 0.3×0.6 to 17×17 mm; DFN/QFN thickness ≥0.30 mm; leaded discretes ≥0.38 mm; SOIC ≥0.90 mm
ThroughputLED 35k / discrete DFN 30k / SOIC 25k / power discrete 20k / QFN + pneumatic ejector 17k UPH
Contact forceStandard 7N; optional 27N high force / 50N pneumatic ejector
Inspection depthNVcore six-sided; Aquilae HR sidewall 5 µm; Aquilae Infrared internal cracks; 3D Flex ball/bump coplanarity
Operational reliabilityMTBA >2h; MTBF >168h; changeover <60min
Training thresholdL1 operations 2 days; L2 maintenance 5 days + 30 days experience; L3 advanced 7 days + 6 months experience
Core function positioningU.S. customs ruling: primary function is optical inspection, sorting and packaging secondary