Semiconductor test equipment verifies device functionality and performance. This category includes ATE systems (SoC, mixed-signal, PMIC), test handlers (pick-and-place, gravity, turret), and probe stations (manual, semi-automatic, automatic). Key selection factors are tester interface, site count, temperature range, and package format.
Each equipment category below leads to a dedicated page with more specific product information, model-level content and inquiry options.
Probes touch down on chip pads to measure electrical performance and pass signals—that's a Probe Station, gear for semiconductor testing.
Test Handler manages and executes software tests—scheduling cases, processing data, capturing results, and generating reports for automation testing.
ATE System is hardware and software for automated testing of semiconductors or electronic components—executing tests, collecting data, and determining pass/fail.
Use this category page to identify the correct equipment type first, then move into the product-level discussion with more complete technical and commercial information.
Start from the process objective or machine type when a complete equipment model number is not yet available.
Share available nameplate information, machine photos, specifications or configuration requirements.
Clarify whether the request concerns used equipment, refurbished equipment, available inventory or a specific sourcing target.
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A more complete initial request helps reduce unnecessary back-and-forth and makes it easier to identify the correct equipment category, configuration direction and sourcing path.