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Used ACCRETECH / TSK UF3000EX Wafer Prober for Sale

Used ACCRETECH / TSK UF3000EX automatic wafer prober for 300 mm wafer testing. GK-SEMI helps match available equipment to your tester interface, chuck temperature requirements and budget. Contact us for configuration details, equipment condition and a quotation.

  • Brand ACCRETECH / Tokyo Seimitsu (TSK)
  • Wafer Size 200 mm (8-inch) 300 mm (12-inch)
  • Model ACCRETECH / TSK UF3000EX (UF3000 Series)
  • Condition Refurbished / Fully Tested / Production-Ready
  • Availability In Stock at GK-SEMI (Ready for Global Shipping)
Used ACCRETECH / TSK UF3000EX Wafer Prober for Sale EQUIPMENT IMAGE
Configuration Review Model and installed options
New / Used Supply Subject to project availability
Global Delivery Destination-based assessment
Technical RFQ Package and process matching

The ACCRETECH / TSK UF3000EX is an industry-benchmark fully automatic wafer prober engineered for high-precision electrical characterization and high-mix, high-volume production. Built on the renowned TSK UF3000 series architecture, the UF3000EX provides outstanding wafer sort capability, precise sub-micron positioning, and reliable optical alignment across both 200mm and 300mm wafer formats.

At GK-SEMI, we provide production-ready used TSK prober stations that have passed rigorous multi-point functionality tests, vacuum seal diagnostics, and optical calibration, offering a cost-effective alternative to purchasing new equipment.

Technical Specifications: TSK UF3000EX

ParameterConfiguration Details
ManufacturerTokyo Seimitsu Co., Ltd. (ACCRETECH / TSK)
Model SeriesUF3000 / UF3000EX
Wafer Diameter200 mm (8-inch) & 300 mm (12-inch) dual handling
Alignment AccuracyOptical Target Scope (OTS), ±2.0 µm or better
Chuck TemperatureAmbient / Hot Chuck / Tri-Temp (-55°C to +150°C / +200°C)
Probe Card SizeUp to 440 mm (17.3-inch) standard interface
Stage DriveHigh-rigidity quad-axis Z-stage with low contact force control
Automation NetworkSECS/GEM, Light-VegaNet, VegaNet, Ethernet

Key Advantages of the Accretech Prober Platform

  • High Indexing Velocity: Maximizes test throughput with ultra-fast XY motion and automated wafer transfer.

  • Low Contact Force Protection: Micro-step Z-drive prevents damage to sensitive wafer surfaces, pads, and low-k materials.

  • Universal ATE Compatibility: Effortless docking with major tester heads (Advantest, Teradyne, etc.).

GK-SEMI Certified Inspection & Packaging

Every accretech uf3000 delivered by GK-SEMI undergoes complete stage testing, motor drive diagnostics, thermal calibration, and vacuum leak verification. All units are vacuum sealed with desiccant in cleanroom-grade packaging and crated in heavy-duty wooden boxes for safe international transit.

Frequently Asked Questions

Q: Can this TSK UF3000EX handle both 8-inch and 12-inch wafers?

A: Yes. The system supports dual wafer diameter operations with the appropriate conversion kits and chuck configurations.

Q: Do you offer live machine power-on video inspection?

A: Yes, we provide full video documentation demonstrating wafer exchange, optical alignment, and system self-tests before shipment.