Why Choose the TEL P-8 for 200mm Wafer Testing?
The TEL P-8, manufactured by Tokyo Electron (TEL), is an established automatic wafer probing platform used in mature semiconductor manufacturing and testing applications.
For facilities operating 150mm and 200mm production lines, purchasing a pre-owned TEL P-8 can be a practical alternative to investing in new equipment, particularly when maintaining compatibility with existing test programs, probe cards and production infrastructure is a priority.
The platform may be suitable for wafer-level testing applications involving power devices, analog and mixed-signal ICs, discrete semiconductors and other mature semiconductor technologies, subject to the installed configuration and process requirements.
Key Advantages
Established Mechanical Platform
The TEL P-8 uses a precision motion system designed for automated wafer positioning and probing. Stage accuracy and repeatability should be confirmed through inspection and calibration of the individual machine.
Integration with Existing Test Systems
The equipment can be evaluated for integration with ATE systems from manufacturers such as Teradyne, Advantest, Credence and other suppliers. Actual compatibility depends on the tester interface, docking arrangement, control software and probe card configuration.
Spare Parts and Maintenance Support
Replacement components and maintenance services may be available for mechanical assemblies, control boards, motors, optical systems, vacuum components and related subsystems. Parts availability is confirmed against the machine version and component part numbers.
Cost-Effective Capacity Expansion
A properly inspected pre-owned TEL P-8 may help reduce equipment acquisition costs when expanding mature-node wafer test capacity or replacing an existing prober.
TEL P-8 Technical Specifications
The following specifications describe general platform capabilities and possible configurations. Exact specifications must be verified against the available machine.
| Manufacturer | Tokyo Electron (TEL) |
| Model | TEL P-8 |
| Equipment Type | Automatic Wafer Prober |
| Wafer Size | 150mm / 200mm, subject to machine configuration |
| Wafer Loading | Automatic wafer handling; cassette and transfer configuration to be confirmed |
| X/Y Stage | Precision automated wafer positioning system |
| Z-Axis | Programmable vertical movement and probe contact control |
| Theta Alignment | Wafer rotational alignment; actual adjustment range to be verified |
| Vision System | Optical wafer alignment and pattern recognition, depending on installed hardware |
| Chuck Temperature | Ambient or optional temperature-controlled configuration; operating range to be confirmed |
| ATE Interface | Depends on installed controller, interface boards and software |
| Probe Card Interface | Probe card holder and docking configuration to be confirmed |
| Equipment Condition | As-Is / Tested / Refurbished options |
Equipment Inspection and Refurbishment Services
GK-SEMI / Xinling provides equipment inspection, configuration verification and refurbishment support according to the condition of the available TEL P-8 and the customer's requirements.
The following inspection and servicing items can be discussed before quotation. The final scope depends on the purchased condition grade and agreed acceptance criteria.
1. Stage Calibration and Motion Verification
Inspect X, Y and Z motion assemblies for mechanical wear and abnormal movement.
Clean and lubricate applicable guideways and mechanical transmission components.
Check stage positioning, alignment and repeatability.
Verify travel limits, homing operations and relevant sensors.
2. Chuck and Temperature System Inspection
Inspect wafer chuck surface condition and mounting stability.
Check chuck vacuum hold-down performance.
Verify chuck movement and applicable leveling adjustments.
Test temperature control functions when a thermal chuck is installed.
3. Optical Alignment and Pattern Recognition
Inspect camera, lens and illumination assemblies.
Check image clarity, focus and lighting performance.
Verify wafer alignment and pattern recognition functions where supported.
Evaluate alignment operation using suitable test wafers when available.
4. Pneumatic and Vacuum System Inspection
Inspect pneumatic tubing, seals, fittings and vacuum connections.
Check vacuum valves and related control components.
Verify wafer handling and chuck vacuum functions.
Replace damaged or deteriorated components where included in the refurbishment scope.
5. Electrical and Control System Verification
Inspect power supplies, control boards and electrical connections.
Check emergency stop functions and safety interlocks.
Verify controller startup and machine initialization.
Test available communication interfaces against the customer's ATE requirements.
Conduct functional cycling or extended running tests when agreed and technically feasible.
Available Customization and Retrofit Options
Depending on the machine configuration and technical feasibility, GK-SEMI can assist with selected modifications to support existing semiconductor test operations.
Display and Operator Interface Upgrades
Legacy display components may be evaluated for replacement or modernization. Compatibility with the original controller and video interface must be verified before modification.
Data Storage Modernization
For systems using legacy storage media, compatible solid-state storage or floppy drive emulation solutions may be considered to simplify program storage and backup.
ATE Tester Docking and Interface Support
We can evaluate mechanical docking arrangements, tester interface requirements, probe card mounting and related connection components according to the customer's existing ATE platform.
Special Wafer and Substrate Handling
Handling modifications for thin wafers, special substrates or non-standard wafer configurations may be evaluated on a project basis. Feasibility depends on the transfer mechanism, chuck design and substrate characteristics.
What to Confirm Before Purchasing a TEL P-8
To recommend an appropriate configuration and provide an accurate quotation, please share the following information with our equipment team.
Wafer Specifications
Wafer diameter: 150mm or 200mm
Wafer thickness and substrate material
Backside metallization or special surface requirements
Any special wafer handling requirements
Test Conditions
Required test temperature range
Probe contact and overdrive requirements
Required positioning accuracy and repeatability
Wafer alignment and pattern recognition requirements
Tester and Probe Card Configuration
ATE manufacturer and model
Probe card dimensions and interface type
Existing tester docking and manipulator arrangement
Required communication interfaces
Factory Utilities
Available power supply voltage and frequency
Compressed dry air requirements
Available vacuum supply
Installation space and cleanroom requirements
TEL P-8 Equipment Supply and Worldwide Delivery
GK-SEMI / Xinling supplies pre-owned semiconductor equipment to customers worldwide. We support equipment sourcing, configuration checking, inspection coordination, spare parts requirements and international shipment arrangements.
Available TEL P-8 machines may differ in production year, controller version, wafer handling accessories, chuck type and installed interface hardware.
Before confirming an order, our team can help verify the equipment configuration against your intended application and discuss the available inspection documentation, delivery condition and acceptance requirements.
Export packing, moisture protection and protective wooden crating can be arranged according to equipment dimensions, shipping method and customer requirements.
Request a TEL P-8 Quotation
Looking for a TEL P-8 200mm automatic wafer prober for your semiconductor production line, equipment replacement project or R&D facility?
Contact GK-SEMI / Xinling to discuss machine availability, condition options, compatible configurations and delivery arrangements.
Depending on the available equipment and agreed inspection scope, we can provide machine photographs, configuration information, functional test videos and inspection documentation.
Equipment: TEL P-8 Automatic Wafer Prober
Wafer Size: 150mm / 200mm
Supply: Pre-Owned / Inspected / Refurbished
Shipping: Worldwide
Send us your wafer size, tester model and required equipment configuration to receive a tailored quotation.
